ذكذكتسئµ

Mechanical Engineering

College of Engineering

COE-Materials Instrumentation Center

The Materials Instrumentation Center provides researchers in the ذكذكتسئµ University community with access to high-end instrumentation for the studies of material properties. The Materials Instrumentation Center also supports collaborative research projects with users from other Educational institutes and industries.

Instruments:

Scanning Electron Microscope (Hitachi S-3400N)

Scanning Electron Microscope (SEM) provides information on surface shape, surface finish, surface texture, and structural characterization.

sem

  

Transmission Electron Microscope (JEOL JEM-1400Plus (HR-FC))

Transmission Electron Microscopy (TEM) is an electron microscopy technique that is used to image the fine structure in the scale of several Angstroms (~ 0.19nm).

tem

PEOPLE

Chun-Wei Yao, Ph.D.
Associate Professor
Director, Materials Instrumentation Center

Robert Kelley Bradley, Ph.D.
Assistant Professor
Faculty Advisory Committee

Jenny Zhou, Ph.D.
Associate Dean of College of Engineering, Professor
Faculty Advisory Committee

For any inquiries or questions regarding instruments, instrument rates, billing, please contact Dr. Yao.